Project leader

ATMEL

Partners

ST Microelectronics, L2MP, LP3, IMS

Funders

FUI,

MADISON

Innovative Failure Analysis Methods by DyNamic Optical Stimulation


To develop integrated circuit failure analysis methods by coupling dynamic optical stimulation with functional test of integrated circuits in a pre-industrial environment.

Project leader

ATMEL

Partners

ST Microelectronics, L2MP, LP3, IMS

Funders

FUI,
Themes Markets R&D Investment Duration Funding Year
Microelectronics
 Other
 2933 K€ 36 months 2008
Themes
Microelectronics
Markets
Other
R&D Investment
2933 K€
Duration
36 months
Funding Year
2008

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