Project leader
ENSAMPartners
ST Microelectronics, EMSEFunders
ANR,Sake
Strain-Stress Analysis by Kossel and EBSD Diffraction
The aim of the project is to develop an innovative tool for stress analysis at fine scales of the microstructure, and this in the chamber of a scanning electron microscope (SEM), by coupling two complementary techniques: EBSD and Kossel diffraction.